TAYLOR HOBSON has released the Talysurf CCI range of non contact optical 3D profilers, said to bring an unparalleled level of performance to non-contact 3D measurement.
The profilers are designed specifically for high performance for the global manufacturing and research market.
Based around the Coherence Correlation Interferometry technique which provides both long scan ranges and a single mode of operation the new range is said to avoid the compromises associated with both phase mode and vertical scanning (white light) mode.
The result is a non-contact 3D surface texture, step height and micro dimensional measurement system that can provide results in seconds.
The instrument is designed to be versatile and can be used on all types of rough or highly reflective materials, including glass, metal, photo resist, polymer, liquid inks and pastes.
The instrument is an invaluable tool in the manufacture of automotive components, bearings, MEMS (micro electro-mechanical systems), super-polished optical components, semiconductor devices and many other applications.
The Talysurf CCI lite includes many automation features not normally found on tabletop systems, these include automatic pattern measurement and X, Y stitching.
The unique Z stage is closed loop over its full 100 mm range leading to high accuracy Z stitching. Careful design and construction assures stability throughout the measuring loop, an important requirement for high quality metrology.
The system is offered as standard with a high sensitivity 1 million pixel image sensor leading to excellent data resolution in the X and Y axes and combined with a very low missing data rate, class leading surface detail is achieved.
Lenses offering up to 7 mm field of view are available; larger field of view enables faster stitching as fewer images are required.
A turret is also available to improve easy of use when multiple lenses are required. Measurement set up is simple.
Place a component onto the positioning stage, focus on the surface (auto focus is included), select the Z scan range (up to 2 mm) and pushes the start button.
Very little component preparation is required with the sample only needing to be free from contamination. More complex samples can be measured using a combination of stitching, auto focus, fixtures, jigs and vacuum chucks.
Preparation and staging of the component is greatly simplified because the measured data can be software leveled and aligned.
Routine calibration is simple and can be carried out with Taylor Hobson’s traceable artifacts as well as other specialised artifacts.
The routines can be used to calibrate the instrument’s vertical and lateral measurement axes. The geometrical, dimensional and surface characteristics of any known artifact can therefore be easily reproduced with confidence.
Detailed measurement and analysis can automatically be carried out with the press of a button. Surface features defined by diameter, area or volume can be automatically identified, measured and sorted.
Internationally recognized waviness and roughness parameters in both 3D and 2D are included and dimensional measurement in X, Y and Z axes provided.
Presentation tools include user-defined scale, viewing angle and rotation, plus photo-realistic images in monochrome or full-color providing a natural view of 3D planar surfaces.
A full package of desktop publishing tools, including templates for repetitive tests; aids consistent, comprehensive documentation of measurement results and analysis.